Written by Fulin Liu and Charlie Pryor


Board Level mechanical tests are an essential quality control test within the microelectronics packaging industry. They provide testing data to support IC components' performance against interconnect failures during shipment and in end-use products where cyclic stresses and shock from impact are experienced.

The JEDEC JESD22B113 test method is used to evaluate and compare surface mounted electronic components' performance in an accelerated test environment for handheld electronic products applications. This is done by using a specified 4-point cyclic bending test method.


The standard recommends a specimen design similar in size and layout to a drop Impact test. It specifies the spans and the cyclic amplitude, frequency, and waveform for performing this test. Interconnection failure is determined based on resistance daisy chains, typically five times the initial resistance or 1000ohms, whichever is higher. The challenge of the JEDEC JESD22B113 test that an operator must have the test system continuously generate the flexural loading based on a specified cyclic waveform on the printed wiring board (PWB) via the 4-point bend to long-time fatigue – up to 200,000 cycles at 1-3Hz frequency without lateral specimen shifting.

Instron® ElectroPuls® systems E1000, E3000, and E3000NB are the ideal test machines for micro-electronic fatigue testing. E1000, E3000, and E3000NB material testing instruments use patented linear motor technology, offer slow-speed static and high-frequency fatigue testing. It includes Instron advanced digital control electronics, Dynacell load cell, Console software, and the very latest in testing technology – hassle-free tuning based on specimen stiffness. WaveMatrix2 Dynamic Testing Software allows users to quickly and easily construct a wide range of dynamic (waveforms) and quasi-static test methods using minimal steps within a simple matrix structure.

The JEDEC B113 test fixtures CP111414 and CP118691 are specially designed in accordance with the JEDEC JESD22B113 method for performing long-time cyclic 4-point flexural fatigue tests. Easy setup of removable specimen stops is to prevent undesired drifting of the specimen during the cyclic test. As a displacement-controlled test, the fixtures are designed to allow for up to 4 PWB specimens to be tested simultaneously in one setup, which saves time.

JEDEC B113 Fixture
JEDEC B113 Fixture
CP116238 Lower Anvils & CP116241, CP116238 upper Fixture & CP116240 upper pull rod


ElectroPuls® 試験システム

ElectroPuls は単相電源のみで駆動でき、従来の油圧サーボ技術とは異なった環境への影響が少ない、全く新しい疲労試験機です。作動油、三相電源、冷却水が不要です。製品の概要をご覧いただき、お客様の試験環境でElectroPuls™をどのようにご活用いただけるかご検討ください。

Dynacell Fatigue Rated Load Cells

The 2527 Series load cells are designed for use with Dynamic Testing Systems; offering exceptional performance with the ability to measure forces as low as 1/250th of the force capacity to an accuracy of 0.5% of reading. Automatic transducer recognition and electrical calibration, makes them easy to use. The load cells can withstand loads up to 150% of their force capacity without damage and 300% without mechanical failure. All Instron load cells are individually temperature-compensated and tested for accuracy and repeatability on calibration apparatus that is traceable to international standards, with a measurement uncertainty that does not exceed one-third of the permissible error of the load cell.

WaveMatrix2 ソフトウェア

WaveMatrix2 は、材料やコンポーネントの動的および疲労試験用のソフトウェアです。単純な静的ランプ波形から繰返し波形、そして、複雑なマルチステップ試験や多軸試験まで、さまざまな試験を実行できます。直感的でわかりやすいビジュアルな操作環境備えています。

Microelectronics JEDEC B113 Test Fixtures

The JEDEC JESD22B113 test method is to evaluate and compare the performance of surface mount electronic components in an accelerated test environment for handheld electronic products applications by using a specified 4-point cyclic bending test method at 1~3Hz frequency.