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X-ORIGINAL-URL:https://www.instron.com/ko/
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DTSTART;TZID=America/New_York:20260713T090000
DTEND;TZID=America/New_York:20260713T160000
DTSTAMP:20260617T121725Z
CREATED:20260513T193302Z
LAST-MODIFIED:20260617T121725Z
UID:10000674-1783933200-1783958400@www.instron.com
SUMMARY:정적 재료 시험 소개
DESCRIPTION:In this one-day course\, students will learn about materials testing. The course highlights the basics of materials testing including mechanical properties\, different types of testing\, stress/strain test curves\, modulus\, yield\, and application testing with demonstrations on computerized materials test instruments. Students will observe tensile\, compressive\, flexural\, and peel tests to learn to interpret test curves and calculated results. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUnderstand basic materials testing terminology\, theory and concepts\nUnderstand typical force/displacement test curves and be able to distinguish between different types of curves\nDo’s and Dont’s when running typical tensile\, compression\, flexure\, and peel tests\nLearn good testing procedures when using a computerized testing instrument to perform tension\, compression\, flexural and peel testing\nLearn the importance of system calibration for data accuracy\nUnderstand specimen geometry and the importance of specimen dimensions\nCalculate stress\, strain\, elongation\, modulus\, offset yield\, and other advanced calculations\nBe able to interpret test curves and to label major points and results\nUnderstand different types of strain measurements and devices\n\nRegister for This Course
URL:https://www.instron.com/ko/event/introduction-to-static-materials-testing-3/
LOCATION:가상
CATEGORIES:교육
ATTACH;FMTTYPE=image/jpeg:https://www.instron.com/wp-content/uploads/2020/10/free-training-homepage-news.jpg
ORGANIZER;CN="%EC%9D%B8%EC%8A%A4%ED%8A%B8%EB%A1%A0 %EA%B5%90%EC%9C%A1 - %EB%B6%81%EB%AF%B8":MAILTO:training_center@instron.com
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BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260713T100000
DTEND;TZID=America/New_York:20260713T110000
DTSTAMP:20260716T140027Z
CREATED:20260616T155253Z
LAST-MODIFIED:20260716T140027Z
UID:10000152-1783936800-1783940400@www.instron.com
SUMMARY:내구성 설계: 산업용 적층 제조 부품의 피로 성능
DESCRIPTION:적층 제조(AM)는 기능성 산업 응용 분야로 빠르게 진입하고 있습니다. 항공우주\, 자동차\, 생체 의학 산업에 미치는 영향을 살펴보십시오.  \n본 세션에서는 다음 내용을 학습하게 됩니다:\n• 왜 피로가 적층 제조 부품의 산업 적용에 특히 중요한지\n• 공정 기반 변동성이 피로 데이터에 미치는 영향\n• Instron이 적층 제조 부품의 피로 시험을 어떻게 지원하는지 \n지금 등록하십시오
URL:https://www.instron.com/ko/event/designing-for-durability-fatigue-performance-of-additive-manufacturing-components-in-industry/
LOCATION:가상
CATEGORIES:웹 세미나
ATTACH;FMTTYPE=image/jpeg:https://www.instron.com/wp-content/uploads/2026/05/directed-energy-deposition-metal-additive-manufacturing-process.jpg
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260714T090000
DTEND;TZID=America/New_York:20260714T163000
DTSTAMP:20260616T195907Z
CREATED:20260515T120936Z
LAST-MODIFIED:20260616T195907Z
UID:10000376-1784019600-1784046600@www.instron.com
SUMMARY:Bluehill® Universal 테스트 방법 개발 입문
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the basic tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of basic Test Method development. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nRun tests\, generate graphs\, and produce test reports\nSetup calculations and test results\nCreate\, save and retrieve test method and same data files\nSetup test control parameter\nExport results and raw data\nStreamline your workflow using Bluehill best practices\n\nRegister for This Course
URL:https://www.instron.com/ko/event/bluehill-universal-introduction-to-test-method-development-07-14-2026/
LOCATION:가상
CATEGORIES:교육
ATTACH;FMTTYPE=image/jpeg:https://www.instron.com/wp-content/uploads/2026/05/dogbone-with-course-materials.jpg
ORGANIZER;CN="%EC%9D%B8%EC%8A%A4%ED%8A%B8%EB%A1%A0 %EA%B5%90%EC%9C%A1 - %EB%B6%81%EB%AF%B8":MAILTO:training_center@instron.com
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BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260715T090000
DTEND;TZID=America/New_York:20260715T163000
DTSTAMP:20260617T121050Z
CREATED:20260513T194113Z
LAST-MODIFIED:20260617T121050Z
UID:10000596-1784106000-1784133000@www.instron.com
SUMMARY:Bluehill® Universal 고급 시험 방법 개발
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore advanced tools and features of Bluehill Universal. Using a hands-on approach\, the instructor will guide students through a series of projects designed to foster an understanding of advanced Test Method development and administrative controls. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nUtilize the Expression Builder function through the method development process\nUnderstand calculation and graphical domains\nUnderstand virtual measurements utilization\nSetup custom transducers\nUnderstand the features on Instron Connect\nSetup software Security and login settings\n\nRegister for This Course
URL:https://www.instron.com/ko/event/bluehill-universal-advanced-test-method-development-4/
LOCATION:가상
CATEGORIES:교육
ATTACH;FMTTYPE=image/jpeg:https://www.instron.com/wp-content/uploads/2026/05/high-wycombe-classroom-training.jpg
ORGANIZER;CN="%EC%9D%B8%EC%8A%A4%ED%8A%B8%EB%A1%A0 %EA%B5%90%EC%9C%A1 - %EB%B6%81%EB%AF%B8":MAILTO:training_center@instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260716T090000
DTEND;TZID=America/New_York:20260716T163000
DTSTAMP:20260616T194557Z
CREATED:20260515T120940Z
LAST-MODIFIED:20260616T194557Z
UID:10000342-1784192400-1784219400@www.instron.com
SUMMARY:Bluehill® Universal TestProfiler 방법 개발
DESCRIPTION:In this one-day course\, students will work with a certified Instron training instructor to explore the various tools and functions of Bluehill Universal’s powerful TestProfiler feature. Using a hands-on approach\, the instructor will guide students through a series of realistic projects designed to prepare the student for the unique demands of his or her laboratory. Download the course outline to see the full program. \nAfter completing this course\, you will be able to: \n\nDesign your own TestProfiler tests\nCreate\, load\, and save your own profiler waveforms\nUse enhanced load or strain control\nCreate different waveforms – absolute/relative ramps\, triangle\, holds and more\nSelect results from specific test segments\nAugment test sequences with Actions and Events\nUtilize domain expressions based on waveform\n\nRegister for This Course
URL:https://www.instron.com/ko/event/bluehill-universal-testprofiler-method-development-07-16-2026/
LOCATION:가상
CATEGORIES:교육
ORGANIZER;CN="%EC%9D%B8%EC%8A%A4%ED%8A%B8%EB%A1%A0 %EA%B5%90%EC%9C%A1 - %EB%B6%81%EB%AF%B8":MAILTO:training_center@instron.com
END:VEVENT
BEGIN:VEVENT
DTSTART;TZID=America/New_York:20260722T110000
DTEND;TZID=America/New_York:20260722T120000
DTSTAMP:20260618T180502Z
CREATED:20260618T180502Z
LAST-MODIFIED:20260618T180502Z
UID:10000686-1784718000-1784721600@www.instron.com
SUMMARY:귀하의 애플리케이션에 적합한 신율계는 무엇입니까?
DESCRIPTION:적절한 신율계를 선택하는 것은 재료 시험실에서 내릴 수 있는 가장 중요한 결정 중 하나이지만\, 선택 가능한 옵션의 범위가 너무 넓어 당혹스러울 수 있습니다. 본 웨비나는 기초적인 분류 시스템부터 실제 애플리케이션 매칭에 이르기까지 신율계의 전반적인 환경을 안내함으로써 복잡함을 해소해 드립니다. 현재 설정을 평가 중이든 새로운 신율계 기술을 고려 중이든\, 본 세션은 확신을 가지고 애플리케이션 중심의 결정을 내릴 수 있는 실질적인 프레임워크를 제공할 것입니다. 또한 실리콘 밸리에 기반을 둔 독립 재료 시험실인 Covalent가 고객을 위한 재료 시험 시 Instron AVE3 비디오 신율계를 사용한 경험을 공유하며 통찰력을 제공할 예정입니다.   \n주제: \n\n신율계란 무엇인가\, 정확한 재료 시험을 위해 왜 필요한가\, 그리고 분류 표준이 특정 애플리케이션 요구 사항과 어떻게 연결되는가\n클립온\, 롱 트래블\, 자동 접촉식 및 스트레인 게이지를 포함한 접촉식 신율계 유형 간의 주요 차이점과 각 유형이 탁월한 성능을 발휘하는 시나리오\n비접촉식 광학 신율계의 작동 원리와 정확도\, 시편 보호 및 워크플로 효율성 측면에서 제공하는 이점\n시험실의 시험 수요\, 재료 및 처리량 요구 사항에 따라 신율계 옵션을 평가하는 방법\n배터리 테스트의 박막 및 호일 사례를 포함하여 다양한 재료 애플리케이션에 걸쳐 비디오 신율계를 도입한 Covalent의 고객 관점과 이를 통해 얻은 반복성\, 처리량 향상 및 작업자 변동성 감소 효과\n\n지금 등록하기
URL:https://www.instron.com/ko/event/which-extensometer-is-right-for-your-application/
LOCATION:가상
CATEGORIES:웹 세미나
ATTACH;FMTTYPE=image/jpeg:https://www.instron.com/wp-content/uploads/2026/06/instron-ave3-advanced-video-extensometer-used-for-full-field-strain-mapping.jpg
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