Button and Switch Compression Testing
In today's automobiles, a single click of a button or switch is used everywhere, including starting the engine, dashboard controls for entertainment and diagnostic information, and advanced door locking systems. This makes it critical to test the functionality of buttons and switches as the risk of a defective button could be very high, the driver not being able to enter or turn on the vehicle. Mechanically testing buttons is mainly compression testing to understand how much force is required to push a button to engage the electrical signal. This is also known as tactility testing of buttons where OEMs are interested in testing to determine the "feel" of a button.
Instron offers various XY stages that can move to test multiple buttons on the same specimen. Standard and custom solutions are available to hold specimens securely during testing. Instron’s Custom Solutions Group is committed to working with customers on designing probes of different materials and sizes based on specimen and application requirements, in addition to the various standard probes offered. Instron also offers a multiple point compression software solution strictly designed for testing buttons and switches at high speed, parameters include button height and return height, eliminating long travel times.
Automotive Testing Solutions
With more than 70 YEARS of materials testing experience, Instron® delivers impactful innovations to enable our users business to thrive. We are committed to delivering services which delight, as well as usability improvements throughout the lifetime of the system.
XY Test Stage
The Instron® XY Test Stage is designed to accommodate the testing of components, sub-assemblies, and end products.
Knobs and Buttons Tension Torsion Testing
While the world is moving towards touch technology where we interact with swipes, knobs and buttons are still very common in the interior of automobiles.
Translation and Clamping Stages
Translation and clamping stages are used to precisely position and align a test specimen below the actuator. These are commonly used for securely positioning microelectronic circuit boards and components within the testing system.