Instron offers an extensive range of fully-integrated dynamic and fatigue testing systems from 1000 N up to 5000 kN. Incorporating servohydraulic, servo-electric and linear motor technologies, these test instruments cover a broad range of fatigue, dynamic, and static testing applications. These applications include high-cycle fatigue, low-cycle fatigue, thermo-mechanical fatigue, fracture mechanics, crack propagation and growth studies, fracture toughness, bi-axial, axial-torsional, multi-axial, high strain rate, quasi-static, creep, stress-relaxation, and other types of dynamic and static tests.
Dynamic and Fatigue Test Systems
Damper Test Systems
The damper test systems are ideal for evaluating the damping force of two/four-wheeler/rail shock absorbers. These are available in single and dual station modules. Many other damper specific application systems are available to explore
More InfoGeneral Purpose Hydraulic Fatigue
General purpose servohydraulic systems ideal for high-cycle and low-cycle fatigue, fracture mechanics and quasi-static testing.
More InfoServo Electric Test Systems
Servo Electric Actuator Systems are uniquely designed for the low strain rate requirements of LCF testing, utilizing electric technology to minimize infrastructure requirements and running costs.
More InfoAxial Torsion Test Systems
Axial Torsion Test Systems handle both axial and torsional displacement on the specimen and specimen fixturing without backlash along either axis.
More InfoBiaxial Cruciform Test Systems
Biaxial cruciform testing systems combine the axial loading of four independent actuators to deliver precision center-point control for studying in-plane biaxial material fatigue properties.
More InfoHigh Temperature Fatigue
High temperature fatigue testing includes Low Cycle Fatigue (LCF), Thermomechanical Fatigue (TMF) and Electro-Thermal Mechanical Testing
More InfoDynamic Calibration Kit
Determination of measurement uncertainty related to static operations on a testing machine is relatively easy. Dynamic calibration of the test system is complex.
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