Whether your application involves displays, buttons, wires, batteries, full devices, or microelectronic components and assemblies such as printed circuit boards and chips, Instron offers a comprehensive range of testing accessories for tensile, compression, bend, peel, shear, and puncture testing. All accessories are engineered for the precision and repeatability that electronics and microelectronics testing demands — where forces are often measured in millinewtons and specimen dimensions in microns.
Instron offers a variety of grips for tensile testing of electronic devices and microelectronic components — including leads, wires, thin films, and irregularly shaped assemblies. Select grip models feature jaw faces that can be offset to accommodate lap shear testing of bonded components.
Available Grips
| Description | Capacity | Catalog Number | |
| Pneumatic Side Action Tensile Grips | 50 N - 10 kN | 2712-04x and 2712-05x Series | Learn More |
| Screw Side Action Tensile Grips | 100 N - 10 kN | 2710-100 Series | Learn More |
| Micro Pneumatic Side Action Tensile Grips | 10 N | 2712-101 | Learn More |
| Pneumatic Lead Pull Grip | 500 N | 2712-212 | Learn More |
| Wire Pull Hook Fixture | 10 N | 2860-001 | Contact Us |
Flexure Fixtures
Three-point and four-point bend fixtures are used to characterize the flexural strength of electronic devices, components, and miniature microelectronic components. In addition to the fixtures listed below, Instron manufactures a variety of larger bend fixtures with wider spans for testing displays and full-size devices — contact us for details.
Available Fixtures
| Description | Capacity | Span | Catalog Number | |
| 5 kN Flexure Fixture | 5 kN | 10 - 194 mm 4 - 188 mm |
2810-400 | More Info |
| 4 Point Bend Fixture to JEDEC 9702 | 5 kN | Max Upper: 125 mm Max Lower: 225 mm |
CP111689 | Contact Us |
| 3 & 4 Point Bend Fixture for Glass Testing | 2 kN | 20 - 200 mm | CP120055 | More Info |
| Miniature 3 Point Bend Fixture Optional 4 Point Anvil |
2 kN 2 kN |
3 - 105 mm | 2810-412 2810-413 |
More Info |
| Micro 3 Point Bend Fixture | 1 kN 100 N |
3 - 10 mm 1 mm |
2810-411 2810-410 |
More Info |
| High Precision Micro 3 Point Bend Fixture to SEMI G86-0303 | 1 kN 1 kN |
3 - 10 mm 3 - 25 mm |
CP101568 CP117370 |
More Info |
Adhesive Test Fixtures
Peel and stud pull fixtures are used for testing the adhesive bond strength of laminated materials and bonded components — including copper runners on printed circuit boards, thin film coatings, adhesive tapes, semiconductor dies, and other bonded structures.
Available Fixtures
| Description | Capacity | Catalog Number | |
| 90° Angle Peel Fixture | 1 kN | 2820-035 | Learn More |
| Variable Angle Peel Fixture | 1 kN | 2820-036 | Learn More |
| Miniature 90 Degree Peel Fixture | 1 kN | 2820-034 | Learn More |
| Miniature Variable Angle Peel Fixture | 1 kN | 2820-033 | Learn More |
| Stud Pull Fixture Specimen Preparation Fixture for Stud Pull Tests |
5 kN | 2860-300 2860-301 |
Learn More |
| Stepped Jaw Vice Clamp | 500 N | 2860-210 | Learn More |
Three-Jaw Chuck and Testing Probes
The three-jaw chuck is a versatile fixture for holding cylindrical or irregularly shaped specimens during compression testing. A variety of probes can be attached to the chuck for performing point-based compression tests on buttons, displays, and other electronic and microelectronic components — providing a quick and secure way to adapt the testing system to a wide range of specimen geometries without custom tooling.
The component test plate is a large plate featuring an array of tapped holes that allows difficult-to-test components and assemblies to be secured in the correct position for tensile, compression, peel, or other mechanical tests. The tapped hole array provides multiple attachment points for custom fixtures and clamps, making it a versatile platform for testing components that cannot be held by standard grips or fixtures.
AT2 Automated XY Stage
Automated XY stages enable automated compression, flexure, and tensile testing of multiple specimens in a single test run, or testing of devices and components with multiple test points — significantly improving throughput and repeatability compared to manual single-point testing. Commonly used for displays, buttons, keyboards, and electronic components.
Frame Compatibility
| Description | Test Type | |
| Automated XY Stage for Universal Testing Systems | Static Testing | Learn More |
| Automated XY Stage for ElectroPuls Systems | Fatigue Testing | Learn More |
Translation and clamping stages provide precise positioning and alignment of test specimens below the actuator — essential for microelectronics testing where the probe must be centered accurately on the target component or test point. Commonly used for positioning printed circuit boards, chip packages, and other small components within the testing system.
The Torsion Add-On 3.0 enables simultaneous or independent axial and torsional testing on 6800 Series universal testing systems — expanding laboratory capability to include torsion testing of flexible electronics, components, buttons, wires, and flexible printed circuits. Ideal for simulating the real-world twisting and flexing loads that flexible electronic products experience in use and during assembly.
Digital I/O boards and expansion channels can be added to universal testing frames to interface with external measurement devices — including voltage and resistance measurement equipment used in microelectronics testing to correlate electrical output with applied mechanical load. This enables simultaneous capture of mechanical and electrical data within Bluehill® Universal software.
To ensure that your test results are of the highest quality, Instron designs and manufactures all of our own load cells. Instron load cells are carefully engineered to meet the unique requirements of materials testing systems, including high accuracy over a wide measurement range, high stiffness, resistance to offset loads, accurate alignment, and excellent zero stability. For electronics and microelectronics testing, we offer a wide range of low capacity load cells suitable for testing at low forces.
Commonly Used Capacities
| Description | Catalog Number | |
| 5 N Static Load Cell | 2530-5N | Learn More |
| 10 N Static Load Cell | 2530-10N | Learn More |
| 50 N Static Load Cell | 2530-50N | Learn More |
| 100 N Static Load Cell | 2530-100N | Learn More |
| 500 N Static Load Cell | 2580-500N | Learn More |
| 1 kN Static Load Cell | 2580-1KN | Learn More |
| 2 kN Static Load Cell | 2580-2KN | Learn More |
| 5 kN Static Load Cell | 2580-5KN | Learn More |
Many electronic devices and microelectronic components are expected to withstand extreme temperatures both during the assembly process and in normal use. With an environmental chamber, you can characterize the performance of your products under a wide range of temperature conditions ranging from -100 °C to +350 °C.
Shear Testing Fixtures
Die and package shear test fixtures are designed to determine the integrity of the connection between a semiconductor die or surface mounted passive elements to package headers or other substrates. These fixtures are used to measure the shear force required to initiate failure of glue, solder, sintered silver, or other bonding agent in accordance with various testing standards, such as MIL STD 883, IPC TM-650, AEC-Q200-006A, or ASTM F1269-13.
Available Fixtures
| Description | Capacity | Catalog Number | |
| Terminal Strength Shear Fixture | 500 N | CP122690 | Learn More |
| Shear Test Fixture to MIL STD 883 | 2 kN | CP124648, S4781A, CP127130, S4752A |
Learn More |
Burst or puncture fixtures are commonly used to test packaging, fabrics, and thin films and separator films found in batteries to determine the resistance of a material to the penetration of a probe. The material is typically held by a set of clamping rings, and undergoes biaxial stresses representative of those encountered during actual use.
Available Fixtures
| Description | Capacity | Catalog Number | |
| Puncture Test Fixture to EN 14477 Includes Two Probes with 0.8 mm Diameter 1 mm Diameter Probe with 0.5 mm Radius |
100 N | CP105780
CP114502 |
Learn More |
| Puncture Test Fixture to ASTM F1306 | 10 kN | SI-14110 | Learn More |
| Ball Burst Compression Fixture | 10 kN | 2810-195 | Learn More |
The height and width of the 6800 Series universal testing systems can be customized to fit specific application requirements. Extra wide frames are typically preferred for testing large displays, full-sized laptops, and electronic packaging materials such as foam and plastic. The extra wide frames can also be equipped with an automated XY stage for testing larger devices, such as full-sized keyboards.